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Test generation algorithm for QCA circuits targeting novel defects and its corresponding fault models

Author Name: Vaishali Dhare, Usha Mehta

Journal Name: Microprocessors and Microsystems

Publisher: Elsevier

Volume: 110

Published Year: October 2024

DOI: https://doi.org/10.1016/j.micpro.2024.105090

Indexed in: Scopus