Author Name Uday Patel, Tanuj Jhankal, P. N. Tekwani, Amit N. Patel and Kuntal Bhattacharjee
Journal Name: IEEE 6th International Conference on Condition Assessment Techniques in Electrical Systems (CATCON)Publisher: IEEE
Published Year: 2022
DOI: https://doi.org/10.1109/CATCON56237.2022.10077642
Indexed IN: Scopus
