ILP Based Power-Aware Test Time Reduction Using On-Chip Clocking in NoC Based SoC

Author Name: Harikrishna Parmar, Usha Mehta
Journal Name: Journal of Low Power Electronics and Applications
Publisher: MDPI AG
Volume Number: 9
Issue Number: 02
Published Year: 2019
DOI: https://doi.org/10.3390/jlpea9020019
Indexed IN: Scopus, Web of Science